Jim Reville of Sinclair Technologies Presents at Network Capacity and Densification Panel at IWCE 2017
Sinclair Technologies, an innovator in antenna manufacturing, has been selected to present on the Network Capacity and Densification: HetNets, Backhaul and FirstNet panel at IWCE 2017. We are proud to announce that Jim Reville, a RF engineering professional with over 30 years industry experience, will be representing Sinclair on this panel.
This session is a part of the Smart Cities and Critical Infrastructure track which will examine the densification of networks for maximum coverage and capacities, both indoors and outdoors. Times and technology have changed the approach of network deployment as there is no longer the need to put up thousands of towers for nationwide coverage. Instead, wireless sites with hetnets, digital antenna systems (DAS), and small cells have become the new norm for today’s communications industry. The number of access sites have increased dramatically as the deployment of these sites are becoming easier and less expensive to build. As a result of the increase in access sites, new problems such as backhaul and C-RAN are becoming more evident. These issues and possible solutions will be discussed with industry experts during the Network Capacity and Densification panel.
Mr. Jim Reville works with the Public Safety Industry on the design, implementation, and support of Land Mobile Radio systems to resolve RF problems in challenging environments. Jim’s contribution to this panel will be his expertise in antenna design and the criteria needed when choosing the correct antenna for the Public Safety Industry. During his presentation, he will be covering the importance of PIM, PIP, and overcoming common installation issues.
Jim will be presenting on Tuesday March 28, 2017 at 8:30am in room S224. The panel will run for 2 hours and will feature a total of four panelists.
Network Capacity and Densification: HetNets, Backhaul and FirstNet
Date: Tuesday, March 28, 2017
Session Number: T215
To learn more about the presentation, click here.